BUZMIC

BUZMIC is an innovative semiconductor carrier analyzer. With the patent-pending technology, BUZMIC can simultaneously conduct four-probe measurement and Hall measurement on wide bandgap semiconductors like GaN without metal contacts. In the conventional method, you need to form metal Ohmic contacts to carry out four-probe measurement and/or Hall measurement. To avoid metal contact formation, mercury probe is also commonly used; however, mercury probe measures impurity concentration rather than the carrier concentration. Also, it does not measure mobility of the carriers. BUZMIC will measure sheet resistance, carrier concentrations and mobility without metal contact formation. It will speed up your research, development, and process control.

Contact Us

+81-3-3734-1212

Seiken Co., Ltd.
10F, Techno-Port Taiju Seimei Building, 2-16-2 Minamikamata
Ota
Tokyo
1440035
Japan

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